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SAE AIR1811 Liquid Cooling Systems

作者:标准资料网 时间:2024-05-17 18:41:14  浏览:9539   来源:标准资料网
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Product Code:SAE AIR1811
Title:Liquid Cooling Systems
Issuing Committee:Ac-9 Aircraft Environmental Systems Committee
Scope:The purpose of this Aerospace Information Report (AIR) is to provide guidelines for the selection and design of airborne liquid cooling systems. This publication is applicable to liquid cooling systems of the closed loop type and the expendable coolant type in which the primary function is transporting of heat from its source to a heat sink. Most liquid cooling system applications are oriented toward the cooling of electronics. Liquid cooling techniques, heat sinks, design features, selection of coolants, corrosion control, and servicing requirements for these systems are presented. Information on vapor compression refrigeration systems, which are a type of cooling system, is found in Reference 1.
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【英文标准名称】:Informationanddocumentation-ConversionofGreekcharactersintoLatincharacters
【原文标准名称】:信息和文献希腊字符对拉丁字符的转换
【标准号】:ISO843-1997
【标准状态】:现行
【国别】:国际
【发布日期】:1997-01
【实施或试行日期】:
【发布单位】:国际标准化组织(IX-ISO)
【起草单位】:ISO/TC46
【标准类型】:()
【标准水平】:()
【中文主题词】:字母(符号);信息;希腊字符;文献工作;变换;拉丁字符;译音
【英文主题词】:Conversion;Documentations;Greekcharacters;Information;Latincharacters;Letters(symbols);Transliteration
【摘要】:Establishesasystemforthetransliterationand/ortranscriptionofGreekcharactersintoLatincharacters.ThissystemappliestothecharactersoftheGreekscript,independentoftheperiodinwhichitisorwasused,i.e.scriptsfromallperiodsofClassicorModernGreek.ReplacesISO/R843.
【中国标准分类号】:A14
【国际标准分类号】:01_140_10
【页数】:12P.;A4
【正文语种】:英语


【英文标准名称】:StandardTestMethodforCountingPreferentiallyEtchedorDecoratedSurfaceDefectsinSiliconWafers
【原文标准名称】:择优统计硅片侵蚀或表面缺陷的标准试验方法
【标准号】:ASTMF1810-1997(2002)
【标准状态】:作废
【国别】:
【发布日期】:1997
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.06
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:
【英文主题词】:defectdensity;dislocation;grainboundary;microscopic;polycrystallineimperfection;preferentialetch;silicon;slip
【摘要】:ThisstandardwastransferredtoSEMI(www.semi.org)May20031.1Thistestmethoddescribesthetechniquetocountthedensityofsurfacedefectsinsiliconwafersbymicroscopicanalysis.Note18212;Practicaluseofadefectcountingmeth
【中国标准分类号】:H82
【国际标准分类号】:29_045
【页数】:4P.;A4
【正文语种】:



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